N. Thomas, R. Bionta, K. Skulina, D. M. Makowiecki
{"title":"X-Ray Lens Design","authors":"N. Thomas, R. Bionta, K. Skulina, D. M. Makowiecki","doi":"10.1364/ild.1990.ltue1","DOIUrl":null,"url":null,"abstract":"Fresnel zone plates and phase plates were developed for use with copper K-alpha X-rays (8 Kev λ = 1.54 Å). Alternating layers of transparent and opaque materials are sputtered onto a substrate, sliced perpendicular to the coating, thinned to a desired thickness and polished. Phase plates are made with a phase shifting layer in place of the opaque layers. Each material combination has a characteristic phase length, or thickness necessary to cause a relative phase shift of π between X-rays passing through the two materials. When phase plates are sliced to a thickness of integral multiple phase lengths, constructive interference occurs in the focal plane, with up to a four-fold increase in intensity compared to a zone plate. The design considerations and comparisons with experiment will be presented.","PeriodicalId":215557,"journal":{"name":"International Lens Design","volume":"37 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Lens Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/ild.1990.ltue1","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Fresnel zone plates and phase plates were developed for use with copper K-alpha X-rays (8 Kev λ = 1.54 Å). Alternating layers of transparent and opaque materials are sputtered onto a substrate, sliced perpendicular to the coating, thinned to a desired thickness and polished. Phase plates are made with a phase shifting layer in place of the opaque layers. Each material combination has a characteristic phase length, or thickness necessary to cause a relative phase shift of π between X-rays passing through the two materials. When phase plates are sliced to a thickness of integral multiple phase lengths, constructive interference occurs in the focal plane, with up to a four-fold increase in intensity compared to a zone plate. The design considerations and comparisons with experiment will be presented.