Modelling an imperfect debugging phenomenon with testing effort

P. K. Kapur, P. S. Grover, S. Younes
{"title":"Modelling an imperfect debugging phenomenon with testing effort","authors":"P. K. Kapur, P. S. Grover, S. Younes","doi":"10.1109/ISSRE.1994.341371","DOIUrl":null,"url":null,"abstract":"A software reliability growth model (SRGM) based on non-homogeneous Poisson processes (NHPP) is developed. The model describes the relationship between the calendar time, the testing effort consumption and the error removal process under an imperfect debugging environment. The role of learning (gaining experience) with the progress of the testing phase is taken into consideration by assuming that the imperfect debugging probability is dependent on the current software error content. The model has the in-built flexibility of representing a wide range of growth curves. The model can be used to plan the amount of testing effort required to achieve a pre-determined target in terms of the number of errors removed in a given span of time.<<ETX>>","PeriodicalId":171359,"journal":{"name":"Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering","volume":"39 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"28","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSRE.1994.341371","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 28

Abstract

A software reliability growth model (SRGM) based on non-homogeneous Poisson processes (NHPP) is developed. The model describes the relationship between the calendar time, the testing effort consumption and the error removal process under an imperfect debugging environment. The role of learning (gaining experience) with the progress of the testing phase is taken into consideration by assuming that the imperfect debugging probability is dependent on the current software error content. The model has the in-built flexibility of representing a wide range of growth curves. The model can be used to plan the amount of testing effort required to achieve a pre-determined target in terms of the number of errors removed in a given span of time.<>
用测试努力对不完美的调试现象建模
提出了一种基于非齐次泊松过程的软件可靠性增长模型(SRGM)。该模型描述了在不完全调试环境下,日历时间、测试工作量消耗和错误消除过程之间的关系。通过假设不完全调试概率依赖于当前软件错误内容,考虑了随着测试阶段的进展而学习(获得经验)的作用。该模型具有表示大范围生长曲线的内在灵活性。该模型可用于根据在给定时间范围内消除的错误数量来计划实现预定目标所需的测试工作量
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信