{"title":"Doping-spike LWIR PtSi schottky IR detector fabricated by molecular beam epitaxy","authors":"T. Lin, J. Park, T. George, E. Jones","doi":"10.1109/DRC.1993.1009625","DOIUrl":null,"url":null,"abstract":"Summary form only given. It is demonstrated that by thinning the p/sup +/ layer to approximately 10 AA, the effective Schottky barrier heights can be reduced without the formation of a potential spike, and, consequently, the undesired tunneling process can be eliminated. Doping-spike PtSi detectors were fabricated on double-side polished Si","PeriodicalId":310841,"journal":{"name":"51st Annual Device Research Conference","volume":"201 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"51st Annual Device Research Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DRC.1993.1009625","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Summary form only given. It is demonstrated that by thinning the p/sup +/ layer to approximately 10 AA, the effective Schottky barrier heights can be reduced without the formation of a potential spike, and, consequently, the undesired tunneling process can be eliminated. Doping-spike PtSi detectors were fabricated on double-side polished Si