Hairong Lei, Qian Dong, C. Teh, Lingling Pu, C. Jen, Steve Lin
{"title":"Nuisance Rate Improvement of E-beam Defect Classification","authors":"Hairong Lei, Qian Dong, C. Teh, Lingling Pu, C. Jen, Steve Lin","doi":"10.1109/asmc54647.2022.9792486","DOIUrl":null,"url":null,"abstract":"The proposed paper presents a case study describing how e-beam defect classification nuisance rate (NR) can be improved by the implementation of a new machine learning classification process in HMI e-Manager even for difficult data (feature boundary is overlay). This is important because low nuisance rate is an importance metric to measure the e-beam defect classification performance and it is usually difficult to obtain the low nuisance rate, especially for difficult defect dataset. Our machine learning (not a deep learning) multiple-phase classification results show that it is an effective way to improve the E-beam defect classification nuisance rate.","PeriodicalId":436890,"journal":{"name":"2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)","volume":"320 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-05-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/asmc54647.2022.9792486","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The proposed paper presents a case study describing how e-beam defect classification nuisance rate (NR) can be improved by the implementation of a new machine learning classification process in HMI e-Manager even for difficult data (feature boundary is overlay). This is important because low nuisance rate is an importance metric to measure the e-beam defect classification performance and it is usually difficult to obtain the low nuisance rate, especially for difficult defect dataset. Our machine learning (not a deep learning) multiple-phase classification results show that it is an effective way to improve the E-beam defect classification nuisance rate.