Nuisance Rate Improvement of E-beam Defect Classification

Hairong Lei, Qian Dong, C. Teh, Lingling Pu, C. Jen, Steve Lin
{"title":"Nuisance Rate Improvement of E-beam Defect Classification","authors":"Hairong Lei, Qian Dong, C. Teh, Lingling Pu, C. Jen, Steve Lin","doi":"10.1109/asmc54647.2022.9792486","DOIUrl":null,"url":null,"abstract":"The proposed paper presents a case study describing how e-beam defect classification nuisance rate (NR) can be improved by the implementation of a new machine learning classification process in HMI e-Manager even for difficult data (feature boundary is overlay). This is important because low nuisance rate is an importance metric to measure the e-beam defect classification performance and it is usually difficult to obtain the low nuisance rate, especially for difficult defect dataset. Our machine learning (not a deep learning) multiple-phase classification results show that it is an effective way to improve the E-beam defect classification nuisance rate.","PeriodicalId":436890,"journal":{"name":"2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)","volume":"320 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-05-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/asmc54647.2022.9792486","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

The proposed paper presents a case study describing how e-beam defect classification nuisance rate (NR) can be improved by the implementation of a new machine learning classification process in HMI e-Manager even for difficult data (feature boundary is overlay). This is important because low nuisance rate is an importance metric to measure the e-beam defect classification performance and it is usually difficult to obtain the low nuisance rate, especially for difficult defect dataset. Our machine learning (not a deep learning) multiple-phase classification results show that it is an effective way to improve the E-beam defect classification nuisance rate.
改进电子束缺陷分类的妨害率
本文提出了一个案例研究,描述了如何通过在HMI e-Manager中实施新的机器学习分类过程来提高电子束缺陷分类的妨害率(NR),即使对于困难的数据(特征边界是覆盖的)。这一点很重要,因为低妨害率是衡量电子束缺陷分类性能的重要指标,通常难以获得低妨害率,特别是对于困难的缺陷数据集。我们的机器学习(非深度学习)多阶段分类结果表明,它是提高电子束缺陷分类滋扰率的有效方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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