Predicted electrical characteristics of 4500 V super multi-RESURF MOSFETs

Y. Kawaguchi, K. Nakamura, A. Yahata, A. Nakagawa
{"title":"Predicted electrical characteristics of 4500 V super multi-RESURF MOSFETs","authors":"Y. Kawaguchi, K. Nakamura, A. Yahata, A. Nakagawa","doi":"10.1109/ISPSD.1999.764066","DOIUrl":null,"url":null,"abstract":"In this paper, we show the optimized device parameters for various voltage multi-RESURF devices based on exact simulation. In addition, we also present, for the first time, the exact static and transient simulation of a 4500 V multi-RESURF device. The distinguishing feature of the multi-RESURF MOSFET is that a storage time exists and that the fall time is extremely small. The multi-RESURF MOSFET was found to be an ideal device for high voltage applications, superior to IGBTs.","PeriodicalId":352185,"journal":{"name":"11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings (Cat. No.99CH36312)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"20","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings (Cat. No.99CH36312)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD.1999.764066","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 20

Abstract

In this paper, we show the optimized device parameters for various voltage multi-RESURF devices based on exact simulation. In addition, we also present, for the first time, the exact static and transient simulation of a 4500 V multi-RESURF device. The distinguishing feature of the multi-RESURF MOSFET is that a storage time exists and that the fall time is extremely small. The multi-RESURF MOSFET was found to be an ideal device for high voltage applications, superior to IGBTs.
预测了4500v超级多路复用mosfet的电特性
本文在精确仿真的基础上,给出了各种电压多路复用器件的优化参数。此外,我们还首次提出了一个4500 V多路复用电路器件的精确静态和瞬态仿真。多路复用MOSFET的显著特点是存在存储时间,且下降时间极小。该多路复用MOSFET被认为是高压应用的理想器件,优于igbt。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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