Equivalence of robust delay-fault and single stuck-fault test generation

Abstract

A link between the problems of robust delay-fault and single stuck-fault test generation is established. In particular, it is proved that all the robust test vector pairs for any path delay-fault in a network are directly obtained by all the test vectors for a corresponding single stuck-fault in a modified network. Since single stuck-fault test generation is a well solved problem, this result yields an efficient algorithm for robust delay-fault test generation. Experimental results demonstrate the efficiency of the proposed technique.<>