{"title":"Tutorial 1","authors":"R. Karri, Peilin Song, O. Sinanoglu","doi":"10.1109/ats.2006.260981","DOIUrl":null,"url":null,"abstract":"This tutorial is most suitable for DFT and Test Engineers, Validation and Verification engineers, Researchers and students in DFT, testing and validation, hardware security.","PeriodicalId":169611,"journal":{"name":"2012 IEEE 30th VLSI Test Symposium (VTS)","volume":"49 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE 30th VLSI Test Symposium (VTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ats.2006.260981","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This tutorial is most suitable for DFT and Test Engineers, Validation and Verification engineers, Researchers and students in DFT, testing and validation, hardware security.
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