MOSFETs SEB & SEGR Qualification Results with SOA Estimation

2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI:10.1109/RADECS.2017.8696132

Sergey A. Iakovlev, V. Anashin, P. Chubunov, A. Koziukov, Kais B. Bu-Khasan, T. A. Maksimenko, A. M. Chlenov

引用次数: 3

Abstract

the paper presents single event effects (SEE) test results for some commercial power MOSFETs obtained at Roscosmos SEE Test Facilities during test campaign in October 2016.

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mosfet SEB和SEGR鉴定结果与SOA估计

本文介绍了2016年10月在俄罗斯联邦航天局SEE测试设施测试期间获得的一些商用功率mosfet的单事件效应(SEE)测试结果。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

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