PDN characteristics of 3D-SiP with a wide-bus structure under 4k-IO operations

A. Sakai, S. Yamada, T. Kariya, S. Uchiyama, H. Ikeda, H. Fujita, H. Takatani, Y. Tanaka, Y. Oizono, Y. Nabeshima, T. Sudo
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引用次数: 2

Abstract

The 4096 bits wide-bus three-dimensional integration device using through-silicon-vias (TSVs) has been designed and fabricated as a demonstrator for power integrity such as power distribution network (PDN) impedance and simultaneous switching output (SSO) noise characteristics. Anti-resonance peak of total PDN impedance was extracted at around 80 MHz. This result was well coincident with maximum SSO noise frequency at around 75 MHz. Further, SSO noise reduction clocking named phase-shift clock has also been implemented to demonstrate the effectiveness as measurement basis.
4g - io操作下宽总线结构3D-SiP的PDN特性
设计并制作了4096位宽总线三维集成器件,作为配电网络(PDN)阻抗和同步开关输出(SSO)噪声特性等电源完整性的演示器。在80 MHz左右提取PDN总阻抗抗共振峰。这一结果与75 MHz左右的最大SSO噪声频率很好地吻合。此外,还实现了称为移相时钟的单点同步降噪时钟,以证明其有效性作为测量基础。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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