Fault detection and self repair in Hsiao-code FEC circuits

Abstract

Wireless signal transmission has become the essential core of modern communication systems. Forward error correction (FEC) has a critical role in securing quality and reliability. FEC circuitry, implemented in nano-technologies, may suffer from transient and permanent fault effects such as radiation-induced single event upsets (SEUs) and aging effects. Such circuits may actually mask non-permanent hardware faults, but possibly at the expense of transmission error correction. Single error correction (SEC)-double error detection (DED) methods are favorably used for rapid error correction within a single clock cycle, and they may even be used for multiple error correction in iterative approaches. But such schemes fail in case hardware faults and transmission faults combine. Where FEC circuits are used in systems that need to be highly dependable over a long life time or which may have limited access for repair, the option of built-in self repair (BISR) may become a must.