{"title":"Verifying finite element simulation for a piezoresistive MEMS sensor","authors":"D. Benfield, W. Moussa, E. Lou","doi":"10.1109/ICMENS.2005.131","DOIUrl":null,"url":null,"abstract":"The use of finite element analysis to simulate the performance of a piezoresistive sensor is a technique that potentially allows for more efficient design and revision of MEMS devices. By comparing the performance of a FEA pressure sensor to that of an actual device as manufactured allows the capabilities of current simulation software in this field to be examined.","PeriodicalId":185824,"journal":{"name":"2005 International Conference on MEMS,NANO and Smart Systems","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-07-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2005 International Conference on MEMS,NANO and Smart Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMENS.2005.131","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The use of finite element analysis to simulate the performance of a piezoresistive sensor is a technique that potentially allows for more efficient design and revision of MEMS devices. By comparing the performance of a FEA pressure sensor to that of an actual device as manufactured allows the capabilities of current simulation software in this field to be examined.