Temperature dependence of Ge/Si avalanche photodiodes

D. Dai, J. Bowers, Zhiwen Lu, J. Campbell, Yimin Kang
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引用次数: 1

Abstract

By combining Si (with a low k-value, <0.1) and Ge (with a high absorption in the infrared range), Ge/Si photodetectors have been demonstrated with high performances [1–2]. Since data-com transceivers are typically operated up to 70°C [3], it is important to characterize the temperature dependence of the photodetectors and to reduce the temperature dependence. However, very little work has been done for analyzing the temperature dependence of Ge/Si SACM APDs. In this paper, we present the characterization of normal-incidence Ge/Si SACM APDs from 10°C to 60°C. Fig. 1 (a) shows the cross section of the present normal-incidence SACM Ge/Si APD, which is the same as that in Ref. [1]. In our experiment, the APD sample has a diameter D=30µm and operated at the wavelength λ=1300nm. Fig. 2 shows the measured dark currents (see the dotted curves) at different temperatures as the bias voltage increases. The I-V curves for the case with an optical illumination of P= −20dBm are also shown in the same figure to give a comparison (see the dashed curves). In our experiment, the temperature ranged from −73°C to 27°C. As the temperature decreases, not only the dark current level changes but also the breakdown voltage decreases. Here the breakdown voltage Vbd is defined as the voltage where the dark current is 100µA. The temperature dependence of the breakdown voltage Vbd is then shown in the inset. One sees that the voltage Vbd increases with the temperature. This is due to the temperature dependence of phonon scattering [4]. Fig. 33 shows the dark current Idark (in logarithmic scale) versus 1/(kT) for different bias voltages. The dark current increases by nearly a factor 2 every 10 °C when Vbias= −15V, which is similar to that for a Ge-Si PIN photodiode shown in Ref. [3]. We have also measured the dark current from 200K–300K. Fig. 4 shows the activation energy extracted from dark current versus temperature, using the relation Id∞T2exp(-Ea /kT). The activation energy decreases as bias voltage increases. This can be explained as follows. At higher bias voltages, the depletion layer becomes wider and consequently the G-R in the space charge region increases. Thus, the dominant source of the dark current becomes the G-R current, which is less sensitive to the temperature.
Ge/Si雪崩光电二极管的温度依赖性
通过结合Si(低k值,<0.1)和Ge(在红外范围内具有高吸收),Ge/Si光电探测器已被证明具有高性能[1-2]。由于data-com收发器通常工作在70°C以下,因此重要的是表征光电探测器的温度依赖性并降低温度依赖性。然而,很少有研究分析Ge/Si SACM apd的温度依赖性。在本文中,我们给出了在10°C到60°C范围内正常入射的Ge/Si SACM apd的表征。图1 (a)为当前正入射SACM Ge/Si APD的截面,与文献[1]相同。在我们的实验中,APD样品的直径为D=30µm,工作波长为λ=1300nm。图2显示了随着偏置电压的增加,在不同温度下测量到的暗电流(见虚线)。光学照度为P= - 20dBm的情况下的I-V曲线也显示在同一图中以进行比较(见虚线)。在我们的实验中,温度范围为- 73°C到27°C。随着温度的降低,不仅暗电流水平发生变化,击穿电压也随之降低。此处击穿电压Vbd定义为暗电流为100µA时的电压。击穿电压Vbd的温度依赖性随后显示在插图中。我们看到电压Vbd随着温度的增加而增加。这是由于声子散射[4]的温度依赖性。图33显示了不同偏置电压下的暗电流Idark(对数刻度)与1/(kT)的关系。当Vbias= - 15V时,暗电流每10°C增加近2倍,这与Ref.[3]所示的Ge-Si PIN光电二极管相似。我们还测量了200K-300K的暗电流。图4显示了从暗电流中提取的活化能随温度的变化,使用关系Id∞T2exp(-Ea /kT)。随着偏置电压的增大,活化能减小。这可以解释如下。在高偏置电压下,耗尽层变宽,从而导致空间电荷区的G-R增大。因此,暗电流的主要来源成为对温度不太敏感的G-R电流。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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