Optimising the dynamic performance of an all-wide-bandgap cascode switch

P. Garsed, R. McMahon
{"title":"Optimising the dynamic performance of an all-wide-bandgap cascode switch","authors":"P. Garsed, R. McMahon","doi":"10.1109/IECON.2013.6699288","DOIUrl":null,"url":null,"abstract":"A SPICE simulation model of a novel cascode switch that combines a high voltage normally-on silicon carbide (SiC) junction field effect transistor (JFET) with a low voltage enhancement-mode gallium nitride field effect transistor (eGaN FET) has been developed, with the aim of optimising cascode switching performance. The effect of gate resistance on stability and switching losses is investigated and optimum values chosen. The effects of stray inductance on cascode switching performance are considered and the benefits of low inductance packaging discussed. The use of a positive JFET gate bias in a cascode switch is shown to reduce switching losses as well as reducing on-state losses. The findings of the simulation are used to produce a list of priorities for the design and layout of wide-bandgap cascode switches, relevant to both SiC and GaN high voltage devices.","PeriodicalId":237327,"journal":{"name":"IECON 2013 - 39th Annual Conference of the IEEE Industrial Electronics Society","volume":"98 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IECON 2013 - 39th Annual Conference of the IEEE Industrial Electronics Society","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IECON.2013.6699288","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

Abstract

A SPICE simulation model of a novel cascode switch that combines a high voltage normally-on silicon carbide (SiC) junction field effect transistor (JFET) with a low voltage enhancement-mode gallium nitride field effect transistor (eGaN FET) has been developed, with the aim of optimising cascode switching performance. The effect of gate resistance on stability and switching losses is investigated and optimum values chosen. The effects of stray inductance on cascode switching performance are considered and the benefits of low inductance packaging discussed. The use of a positive JFET gate bias in a cascode switch is shown to reduce switching losses as well as reducing on-state losses. The findings of the simulation are used to produce a list of priorities for the design and layout of wide-bandgap cascode switches, relevant to both SiC and GaN high voltage devices.
优化全宽带隙级联码开关的动态性能
为了优化级联码开关的性能,建立了一种新型级联码开关的SPICE仿真模型,该开关结合了高压常通碳化硅(SiC)结场效应晶体管(JFET)和低压增强型氮化镓场效应晶体管(eGaN FET)。研究了栅极电阻对稳定性和开关损耗的影响,并选择了最佳值。讨论了杂散电感对级联开关性能的影响,并讨论了低电感封装的优点。在级联码开关中使用正的JFET栅极偏置可以减少开关损耗,也可以减少导通损耗。仿真结果用于生成与SiC和GaN高压器件相关的宽带隙级联开关设计和布局的优先级列表。
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