The enVision Timing Resolver

Abstract

In device-oriented testing, the test program is created in terms of the device's data sheet. Timing diagrams are utilized. This paper examines some ambiguities and redundancies in timing diagrams found in data sheets with regard to automatic test generation. Their resolution is described in a partices is obvious. There are two cases where it becomes more difficult. First, some timing parameters may have both a minimum and a maximum value specified. The question is when to use which? Normally the solution is to use two-pass testing. The second situation is more difficult. There may be edges which must Conform to Several timing relaular device-oriented visual programming language.