Uncertainty analysis on optical testing with a Shack-Hartmann sensor and a point source

SPIE MOEMS-MEMS Pub Date : 2008-02-07 DOI:10.1117/12.762505
D. Kang, Jin Seok Lee, Ho-Soon Yang, J. Hahn
{"title":"Uncertainty analysis on optical testing with a Shack-Hartmann sensor and a point source","authors":"D. Kang, Jin Seok Lee, Ho-Soon Yang, J. Hahn","doi":"10.1117/12.762505","DOIUrl":null,"url":null,"abstract":"In this study, we analyze the uncertainty in an optical testing system using a Shack-Hartmann sensor for a wavefront measurement device. The main uncertainty sources of the optical testing system are the Shack-Hartmann sensor, the image relay optics, and the pinhole source. Using a homemade high-precision plane-wave source as a reference, we develop a simple method to calibrate the optics of the system and the Shack-Hartmann sensor itself. It is found that the wavefront error of a pinhole source is negligible, and that the error due to the image relay optics installed between the test lens and the Shack-Hartmann sensor is 0.030 λ (RMS). By warming up the Shack-Hartmann sensor for about 1 hour, the measurement values are stabilized to within 0.001 λ (RMS). After calibrating the optical testing system with the reference source, overall uncertainty in the optical testing system is reduced to 0.009 λ (RMS). Performance of the optical testing system is evaluated by measuring the wavefront errors of various optical components, such as a numerical aperture (NA) 0.25 aspheric lens and a digital video disc (DVD) pick up lens.","PeriodicalId":130723,"journal":{"name":"SPIE MOEMS-MEMS","volume":"39 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-02-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"SPIE MOEMS-MEMS","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.762505","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

In this study, we analyze the uncertainty in an optical testing system using a Shack-Hartmann sensor for a wavefront measurement device. The main uncertainty sources of the optical testing system are the Shack-Hartmann sensor, the image relay optics, and the pinhole source. Using a homemade high-precision plane-wave source as a reference, we develop a simple method to calibrate the optics of the system and the Shack-Hartmann sensor itself. It is found that the wavefront error of a pinhole source is negligible, and that the error due to the image relay optics installed between the test lens and the Shack-Hartmann sensor is 0.030 λ (RMS). By warming up the Shack-Hartmann sensor for about 1 hour, the measurement values are stabilized to within 0.001 λ (RMS). After calibrating the optical testing system with the reference source, overall uncertainty in the optical testing system is reduced to 0.009 λ (RMS). Performance of the optical testing system is evaluated by measuring the wavefront errors of various optical components, such as a numerical aperture (NA) 0.25 aspheric lens and a digital video disc (DVD) pick up lens.
Shack-Hartmann传感器和点源光学测试的不确定度分析
在本研究中,我们分析了使用Shack-Hartmann传感器作为波前测量装置的光学测试系统中的不确定度。光学测试系统的主要不确定度源有Shack-Hartmann传感器、图像中继光学器件和针孔源。利用自制的高精度平面波源作为参考,我们开发了一种简单的方法来校准系统的光学元件和Shack-Hartmann传感器本身。结果表明,针孔光源的波前误差可以忽略不计,由于安装在测试透镜和Shack-Hartmann传感器之间的图像中继光学器件引起的误差为0.030 λ (RMS)。通过加热Shack-Hartmann传感器约1小时,测量值稳定在0.001 λ (RMS)以内。用参考光源标定光学测试系统后,光学测试系统的总体不确定度降至0.009 λ (RMS)。通过测量数值孔径(NA) 0.25非球面透镜和数字视频光盘(DVD)拾取透镜等不同光学元件的波前误差,对光学测试系统的性能进行了评价。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信