A Digital to Time Converter Assisted TA-TDC with High Resolution for Low Power ADPLL in 22nm CMOS

Liu Wang, Guojing Ye, Yumei Huang
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引用次数: 3

Abstract

In this paper, a time amplifier (TA) based time-to-digital converter (TDC) as a fractional phase detector with high resolution and low power is presented in 22nm CMOS, which is a key module of an ADPLL for low power BLE application. A digital to time converter (DTC) is used for fractional phase prediction to reduce the dynamic range of TDC from at least one DCO cycle to dozens of picoseconds. On this basis, a TA based TDC with narrow dynamic range is proposed to achieve sub-1ps resolution. In addition, a gain digital calibration is added to the TA to increase the gain stability. At 1V supply voltage, the simulated time resolution of the TA-TDC is 0.86ps, and its peak DNL is -0.187LSB and INL is 0.466LSB. The power consumption of the TA-TDC is only 52.89μW at 28MS/s.
用于22nm CMOS低功耗ADPLL的高分辨率数字-时间转换器辅助TA-TDC
本文提出了一种基于时间放大器(TA)的时间-数字转换器(TDC)作为高分辨率低功耗分数阶鉴相器的22nm CMOS器件,该器件是低功耗BLE应用中ADPLL的关键模块。采用数字时间转换器(DTC)进行分数阶相位预测,将TDC的动态范围从至少一个DCO周期降低到几十皮秒。在此基础上,提出了一种基于TA的窄动态范围TDC,实现了低于1ps的分辨率。此外,还增加了增益数字校准,以提高增益稳定性。在1V电源电压下,TA-TDC的模拟时间分辨率为0.86ps,峰值DNL为-0.187LSB,峰值INL为0.466LSB。TA-TDC在28MS/s时的功耗仅为52.89μW。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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