{"title":"Enhanced optoelectronic properties of UV-C light-emitting diode","authors":"Saad Rasheed, Muhammad Usman","doi":"10.1109/NUSOD54938.2022.9894804","DOIUrl":null,"url":null,"abstract":"We numerically analyzed proposed structure named as LED S2 in comparison to reference structure LED S1. In LED S2 we introduced undoped AlGaN and p-AlGaN layers between the electron blocking layer (EBL) and the p-GaN (hole injecting layer). The simulation finding shows proposed structure (LED S2) provide a better strategy for lowering electron overflow and improving hole strength. This enhancement in the properties is the result of maximum recombination of carriers (electron/hole) in the active region. Furthermore, the mismatch between the epi-layers on the p-side reduces, allowing holes to easily move towards the active region.","PeriodicalId":321952,"journal":{"name":"2022 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-09-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NUSOD54938.2022.9894804","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
We numerically analyzed proposed structure named as LED S2 in comparison to reference structure LED S1. In LED S2 we introduced undoped AlGaN and p-AlGaN layers between the electron blocking layer (EBL) and the p-GaN (hole injecting layer). The simulation finding shows proposed structure (LED S2) provide a better strategy for lowering electron overflow and improving hole strength. This enhancement in the properties is the result of maximum recombination of carriers (electron/hole) in the active region. Furthermore, the mismatch between the epi-layers on the p-side reduces, allowing holes to easily move towards the active region.