Novel characterization technique with short and open standards

Abstract

In this paper, through introducing the short and open standards and excluding the match (termination) standard, a technique is proposed to simplify the measurement of symmetric device under test (DUT). Because the short and open standards are usually easier to obtain than the match (termination) standard in terms of cost and/or feasibility, this technique provides more cost-effective and more flexible solution for characterization of symmetric systems and interconnects.