Novel fabrication method and structure of single crystal thin film In0.53Ga0.47As Schottky diodes for potential IR applications

R. Hussin, Yi Luo
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Abstract

Due to their favorable properties, extensive efforts have been done to extend the applications of Schottky diodes into infrared (IR) nonlinear applications. Primarily, efforts have been concentrated in reducing their series resistances and their capacitances in order to increase their cutoff frequencies [1]. Here, we introduce novel single crystal thin film Au-In0.53Ga0.47As Schottky diodes, in which the thickness of the semiconductor is less than the depletion width in the diodes. This leads to a significantly reduced series resistance, which leads to a cutoff frequency of 25 THz. This value is among the highest values reported for Schottky diodes [2]. The diode structure is achieved using a novel film transfer method introduced by our group.
具有潜在红外应用前景的单晶薄膜In0.53Ga0.47As肖特基二极管的新制备方法和结构
由于肖特基二极管具有良好的性能,人们在将其扩展到红外非线性应用方面做了大量的工作。首先,努力集中在降低它们的串联电阻和电容上,以提高它们的截止频率[1]。本文介绍了一种新颖的单晶薄膜Au-In0.53Ga0.47As肖特基二极管,其半导体厚度小于二极管的耗尽宽度。这导致串联电阻显着降低,从而导致截止频率为25太赫兹。该值是肖特基二极管报道的最高值之一[2]。该二极管结构采用本课程组提出的一种新颖的薄膜转移方法实现。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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