Trace routing effects on crosstalk signals in high-density integrated circuits

Yinchao Chen, Shuhui Yang, Liguo Sun, K. Sun
{"title":"Trace routing effects on crosstalk signals in high-density integrated circuits","authors":"Yinchao Chen, Shuhui Yang, Liguo Sun, K. Sun","doi":"10.1109/IPFA.2009.5232656","DOIUrl":null,"url":null,"abstract":"In this paper, we target to investigate the crosstalk between two adjacent traces by studying the effects of their spacing and orientation. It is found that the trace routing is a critical way to reduce the crosstalk between two traces designed in high-density integrated circuits. Simulation results show that two vertical traces result in the smallest crosstalk and that the crosstalk signals are insensitive to the spacing increment between two parallel traces in the range investigated.","PeriodicalId":210619,"journal":{"name":"2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits","volume":"71 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPFA.2009.5232656","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

In this paper, we target to investigate the crosstalk between two adjacent traces by studying the effects of their spacing and orientation. It is found that the trace routing is a critical way to reduce the crosstalk between two traces designed in high-density integrated circuits. Simulation results show that two vertical traces result in the smallest crosstalk and that the crosstalk signals are insensitive to the spacing increment between two parallel traces in the range investigated.
高密度集成电路中串扰信号的走线路由效应
在本文中,我们的目标是通过研究两个相邻走线的间距和方向的影响来研究它们之间的串扰。研究发现,在高密度集成电路设计中,走线布线是减少两条走线间串扰的关键途径。仿真结果表明,两条垂直走线产生的串扰最小,串扰信号对所研究范围内两条平行走线之间的间距增量不敏感。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信