Performance Comparison of a Strong-Arm Latch in Different Ultra-Scaled Technologies

Abstract

This paper compares the performance achievable in different scaled technologies by analog circuits, using a strong-arm latch as an example. The performance analysis has been carried out in a 7-nm and a 16-nm FinFET technologies, and in a 28-nm FDSOI technology, considering different input signal amplitudes, input common-mode voltage levels, process corners, and temperatures. The circuit used for the comparison has been optimized for the 7-nm technology with a supply voltage of 0.9 V and a clock frequency of 1 GHz and scaled, maintaining the same transistor aspect ratio in the other technologies. In typical cases, the 7-nm technology is slower than the 16-nm technology, but it has better performance in terms of power-delay product (PDP). The 16-nm technology features lower delay when the input common-mode voltage is higher than 750 mV, but with larger PDP. The 28-nm technology in all the cases is the slowest in speed and achieves the worst PDP.