A Double-Data- Rate 2 (DDR2) Interface Phase-Change Memory with 533MB/s Read -Write Data Rate and 37.5ns Access Latency for Memory-Type Storage Class Memory Applications

H. Lung, Christopher P. Miller, Chia-Jung Chen, S. Lewis, J. Morrish, T. Perri, R. Jordan, H. Ho, T. Chen, W. Chien, Mark Drapa, T. Maffitt, J. Heath, Yutaka Nakamura, J. Okazawa, K. Hosokawa, M. BrightSky, R. Bruce, Huai-Yu Cheng, A. Ray, Y. Ho, C. Yeh, Wanki Kim, Sangbum Kim, Yu Zhu, C. Lam
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引用次数: 8

Abstract

For the first time, by using a novel multiple individual bank sensing/writing and a memory bank interleave design, we demonstrate a double date rate 2 (DDR2) DRAM like interface phase-change memory (PCM) for M-type storage class memory applications . The write and read bandwidth is equal to 533MB/s, and the random read latency is 37.5ns, while the write latency is 11.25ns supporting a random write cycle of 176.7ns. In addition, a record high switching speed of 128ns with good resistance distribution is demonstrated with a super-fast Set material.
一种具有533MB/s读写速率和37.5ns访问延迟的双数据速率2 (DDR2)接口相变存储器
我们首次使用一种新颖的多个别组传感/写入和存储组交错设计,展示了一种双日期速率2 (DDR2) DRAM,类似于m型存储类存储器应用的接口相变存储器(PCM)。读写带宽为533MB/s,随机读时延为37.5ns,随机写时延为11.25ns,随机写周期为176.7ns。此外,超高速Set材料还实现了创纪录的128ns高开关速度和良好的电阻分布。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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