A new methodology for IC-package thermal co-analysis in 3D IC environment

Abstract

Power on chip is highly temperature dependent in deep sub-micron VLSI. With increasing power density in modern 3D-IC and SiP, thermal induced reliability and performance issues such as leakage power and electromigration must be taken into consideration in the system level design. This paper presents a new methodology to accurately and efficiently predict power and temperature distribution for 3D ICs.