Reliability and performance trade-offs for 3D NoC-enabled multicore chips

Abstract

Three-dimensional (3D) integration provides the benefits of better performance, lower power consumption, and increased bandwidth through the use of vertical interconnects and 3D stacking. The vertical interconnects enable the design of a high-bandwidth and energy-efficient small-world (SW) network-based 3D network-on-Chip (3D SWNoC) for massive multicore platforms. However, the anticipated performance gain of a 3D SWNoC-enabled multicore chip may be compromised due to the potential failures of through-silicon-vias (TSVs) that are predominantly employed as vertical interconnects. In particular, due to the non-homogeneous traffic patterns, heavily used TSVs may wear-out quickly and can also contribute to the wear-out of neighboring TSVs. As a result, the mean-time-to-failure (MTTF) of those TSVs will decrease, which will adversely affect the overall lifetime of the chip. In this paper, we address this traffic-dependent TSV wear-out problem in 3D SWNoC. We demonstrate that by employing an adaptive routing mechanism, we can improve the MTTF of 3D SWNoC significantly while still providing 21% lower energy-delay-product (EDP) compared to a conventional 3D MESH.