Vertical ambipolar barrier transistor based on black phosphorous-tin selenide van der waals heterojunction

He Tian, Cheng Li, Bingchen Deng, F. Xia, Han Wang
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引用次数: 1

Abstract

Dynamically tunable characteristics of a heterojunction between two semiconducting materials offers the potential for building reconfigurable devices that can enable novel functionalities in electronic systems [1-3]. In this work, we study a novel junction between black phosphorus (BP) and tin selenide (SnSe), both with puckered orthorhombic crystal lattices. Due to the narrow bandgap of BP ~0.3 eV and the ~0.8 eV [4] bandgap in SnSe, the junction displays unique p+-p and n-p polarity reversibility subject to electrostatic bias. An ambipolar barrier transistor based on this junction is also demonstrated for the first time. This highly tunable junction can be very attractive for many applications in reconfigurable electronics.
基于黑磷锡硒化范德华异质结的垂直双极势垒晶体管
两种半导体材料之间异质结的动态可调特性为构建可重构器件提供了潜力,这些器件可以在电子系统中实现新功能[1-3]。在这项工作中,我们研究了黑磷(BP)和硒化锡(SnSe)之间的一种新的结,两者都具有皱褶的正交晶格。由于SnSe中BP ~0.3 eV的窄带隙和~0.8 eV[4]的带隙,该结在静电偏置下表现出独特的p+-p和n-p极性可逆性。基于这种结的双极势垒晶体管也首次被证实。这种高度可调谐的结对于可重构电子的许多应用非常有吸引力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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