Modelling of multilayer-dielectric-multilayer amplifying Fabry-Perot microinterferometer using the method of single expression

Abstract

For multilayer-dielectric-multilayer (MDM) amplifying Fabry-Perot microinterferometer analysis an advanced method of single expression (MSE) is applied. The distinctive feature of the method is a presentation of the Helmholtz's equation solution in each layer of a structure in the special form of a single expression. The electrodynamical problem of plane wave interaction with MDM Fabry-Perot structure is solved. The electric field amplitude distribution within and outside of the structure is obtained. The field localization at the resonance state is observed. Including amplification in the dielectric space between multilayer mirrors brings to the transformation of the microinterferometer's transmission peaks to the amplified ones.