A 9.5 inch, 1.3 mega-pixel low temperature poly-Si TFT-LCD fabricated by SPC of very thin films and an ECR-CVD gate insulator

T. Little, H. Koike, K. Takahara, T. Nakazawa, H. Ohshima
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引用次数: 9

Abstract

A unique combination of solid-phase crystallization (SPC) and gate insulator technology has been used to fabricate low-temperature poly-Si TFTs (thin-film transistors). Using this technology, a high-resolution 9.5-in TFT-LCD (liquid crystal display) with 1.3 mega-pixels has been realized. SPC has allowed the formation of poly-Si TFTs with both lower OFF currents and higher ON currents than as-deposited poly-Si TFTs, without sacrificing the latter's inherent advantages of uniformity and large area capability. Meanwhile, ECR-CVD (electron cyclotron resonance chemical vapor deposition) SiO/sub 2/ has allowed excellent control of the MOS interface and eliminates the need for hydrogenation.<>
一个9.5英寸,130万像素低温多晶硅TFT-LCD,由非常薄的薄膜和ECR-CVD栅极绝缘体制成
一种独特的结合固相结晶(SPC)和栅极绝缘体技术已被用于制造低温多晶硅薄膜晶体管(薄膜晶体管)。利用该技术,实现了130万像素的9.5英寸高分辨率TFT-LCD(液晶显示器)。SPC使得形成的多晶硅tft比沉积的多晶硅tft具有更低的OFF电流和更高的ON电流,而不会牺牲后者的均匀性和大面积性能的固有优势。同时,ECR-CVD(电子回旋共振化学气相沉积)SiO/sub 2/可以很好地控制MOS界面,并且消除了加氢的需要。
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