T. Ibuchi, Eisuke Masuda, T. Funaki, H. Otake, T. Miyazaki, Yasuo Kanetake, Takashi Nakamura
{"title":"A study on packaging design of SiC power module using near-field magnetic scanning techniques","authors":"T. Ibuchi, Eisuke Masuda, T. Funaki, H. Otake, T. Miyazaki, Yasuo Kanetake, Takashi Nakamura","doi":"10.1109/IWIPP.2017.7936770","DOIUrl":null,"url":null,"abstract":"This report focuses the current distribution in a module identifiedwith magnetic near-field intensity for optimizing layout and packaging design of silicon carbide (SiC) power module. This measurement methodology can visualize the practical current distribution on a wiring pattern in a module and can estimate the effect of snubber capacitor in a DC-link of half-bridge to suppress the voltage overshoot and ringing oscillation.","PeriodicalId":164552,"journal":{"name":"2017 IEEE International Workshop On Integrated Power Packaging (IWIPP)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE International Workshop On Integrated Power Packaging (IWIPP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IWIPP.2017.7936770","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 10
Abstract
This report focuses the current distribution in a module identifiedwith magnetic near-field intensity for optimizing layout and packaging design of silicon carbide (SiC) power module. This measurement methodology can visualize the practical current distribution on a wiring pattern in a module and can estimate the effect of snubber capacitor in a DC-link of half-bridge to suppress the voltage overshoot and ringing oscillation.