Microdose effects in SRAM cells under heavy ion irradiation

2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI:10.1109/RADECS.2017.8696109

A. Boruzdina, A. Yanenko, A. Ulanova, A. Chumakov, D. Bobrovskiy, V. M. Uzhegov

引用次数: 3

Abstract

The paper presents experimental data of single event hard errors (SEHEs) in commercial SRAM cells during SEE testing and TID tests. It is shown that the numbers of faulty cells under ion and under gamma irradiations are in qualitative agreement.

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重离子辐照下SRAM细胞的微剂量效应

本文给出了商用SRAM单元在SEE测试和TID测试中单事件硬误差(SEHEs)的实验数据。结果表明，离子辐照和γ辐照下的缺陷细胞数量在定性上是一致的。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

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