Adaptive Overclocking and Error Correction Based on Dynamic Speculation Window

R. Ragavan, C. Killian, O. Sentieys
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引用次数: 11

Abstract

Error detection and correction based on double-sampling is used as common technique to handle timing errors while scaling Vdd for energy efficiency. An additional sampling element is inserted in the critical paths of the design, to double sample the outputs of those logic paths at different time instances that may fail while scaling the supply voltage or the clock frequency of the design. However, overclocking, and error detection and correction capabilities of the double sampling methods are limited due to the fixed speculation window which lacks adaptability for tracking variations such as temperature. In this paper, we introduce a dynamic speculation window to be used in double sampling schemes for timing error detection and correction in pipelined logic paths. The proposed method employs online slack measurement and conventional shadow flipflop approach to adaptively overclock or underclock the design and also to detect and correct timing errors due to temperature and other variability effects. We demonstrate this method in the Xilinx Virtex VC707 FPGA for various benchmarks. We achieve a maximum of 71% overclocking with a limited area overhead of 1.9% LUTs and 1.7% flip-flops.
基于动态推测窗口的自适应超频与纠错
基于双采样的误差检测和校正被用作处理定时误差的常用技术,同时缩放Vdd以提高能效。在设计的关键路径中插入一个额外的采样元件,以便在不同的时间实例中对这些逻辑路径的输出进行双倍采样,这些逻辑路径在缩放电源电压或设计的时钟频率时可能会失败。然而,由于固定的推测窗口对跟踪温度等变化缺乏适应性,双采样方法的超频和误差检测和校正能力受到限制。在本文中,我们引入了一种动态推测窗口,用于双采样方案中对流水线逻辑路径中的时序误差进行检测和校正。该方法采用在线松弛测量和传统的阴影触发器方法自适应地对设计进行超频或降频,并检测和纠正由于温度和其他可变性影响引起的时序误差。我们在Xilinx Virtex VC707 FPGA上进行了各种基准测试。我们以1.9%的lut和1.7%的触发器的有限面积开销实现了最大71%的超频。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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