On Design of Low Cost Power Supply Noise Detection Sensor for Microprocessors

Arunkumar Vijayakumar, Raghavan Kumar, S. Kundu
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引用次数: 7

Abstract

Recent trends in CMOS technology scaling have resulted in increased transistor density, higher clock speed and reduced cost per transistor. However technology scaling has also resulted in increased Power Supply Noise (PSN). Power supply noise can result in erroneous computation, reduced performance and lower reliability. Current PSN detectors require either golden supply voltage as reference or bulky analog to digital conversion circuits. This paper introduces a novel PSN detector for active power management in Microprocessors. The proposed detector makes use of the dynamic shift in Voltage Transfer Characteristics(VTC) of an inverter due to supply noise. Simulation results of the proposed PSN detector in 45-nm CMOS technology shows that the detector can detect overshoots or undershoots as small as 10 mV and 100 ps wide. Moreover, the detector works with 10 mV accuracy for a wide temperature range.
微处理器低成本电源噪声检测传感器的设计
CMOS技术缩放的最新趋势导致了晶体管密度的增加,更高的时钟速度和每个晶体管成本的降低。然而,技术规模化也导致了电源噪声(PSN)的增加。电源噪声会导致计算错误,降低性能,降低可靠性。目前的PSN检测器要么需要黄金电源电压作为参考,要么需要笨重的模拟到数字转换电路。本文介绍了一种用于微处理器有源电源管理的新型PSN检测器。该检测器利用了逆变器电压转移特性(VTC)因电源噪声而发生的动态变化。基于45纳米CMOS技术的PSN探测器的仿真结果表明,该探测器可以检测到小至10 mV、宽至100 ps的过调或欠调。此外,该探测器在宽温度范围内工作精度为10 mV。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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