PbTeThin Films Grown by PLD Method

Abstract

In this paper, we report on the structural, mechanical and electrical properties of nanocryst alline lead telluride thin films as a n- and p- type semiconductor deposited on glass substrates at different temperature PLD method. The structure and morphology of the films are characterized by means of X-ray diffractions (XRD) patterns, scanning electron microcopy (SEM).