The Physics and Modeling of Mosfets - Surface-Potential Model HiSIM

Abstract

Semiconductor Device Physics Basic Compact Surface-Potential Model of the MOSFET Advanced MOSFET Phenomena Modeling Capacitances Noise Models Non-Quasi-Static (NQS) Model Leakage Currents Source/Bulk and Drain/Bulk Diode Models Source/Drain Resistances Effects of the Source/Drain Diffusion Length for Shallow Trench Isolation (STI) Technologies Summary of Model Equations Exclusion of Modeled Effects and Model Flags.