{"title":"A Layout Strategy for Reducing the Random Error of Analog Circuit Blocks","authors":"Hsin-Wen Ting, Chi-Yuan Chen, Hsiu-An Liu","doi":"10.1109/GTSD.2016.16","DOIUrl":null,"url":null,"abstract":"Unavoidable process random variation causes mismatches to deviate the performance of many analog circuit blocks. In addition, the correlation between components is also related to the performance parameters of analog circuits. This paper proposes a layout strategy to reduce the random error by making the trade-offs among performance parameter, correlation coefficient, and area allocation cost. Simulation results also confirm the proposed area allocation strategy for typical analog circuit blocks.","PeriodicalId":340479,"journal":{"name":"2016 3rd International Conference on Green Technology and Sustainable Development (GTSD)","volume":"125 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 3rd International Conference on Green Technology and Sustainable Development (GTSD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/GTSD.2016.16","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Unavoidable process random variation causes mismatches to deviate the performance of many analog circuit blocks. In addition, the correlation between components is also related to the performance parameters of analog circuits. This paper proposes a layout strategy to reduce the random error by making the trade-offs among performance parameter, correlation coefficient, and area allocation cost. Simulation results also confirm the proposed area allocation strategy for typical analog circuit blocks.