Direct measurement of facet temperature up to the melting point and COD in high power 980nm semiconductor diode lasers

IEEE 18th International Semiconductor Laser Conference Pub Date : 2002-12-10 DOI:10.1109/ISLC.2002.1041166

Stephen J. Sweeney, Leslie Jamieson Lyons, Alfred R Adams, Daren Alfred Lock

引用次数: 4

Abstract

We measure the high-energy emission from high power lasers and extract the facet temperature. Severe heating is observed up to the onset of catastrophic optical damage (COD).

查看原文本刊更多论文

高功率980nm半导体二极管激光器表面温度及熔点和COD的直接测量

我们测量了高功率激光器的高能发射并提取了表面温度。严重的加热被观察到直到灾难性光学损伤(COD)的开始。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

求助全文

约1分钟内获得全文求助全文

来源期刊

IEEE 18th International Semiconductor Laser Conference

自引率

0.00%

发文量