{"title":"Parameter correction of the microwave differential technique for dielectric constant measurement based on numerical simulation","authors":"M. Noruzi, A. Abdipour, G. Moradi","doi":"10.1109/ICMMT.2008.4540477","DOIUrl":null,"url":null,"abstract":"A resonant-cavity based microwave differential technique has been developed and used for the detection of a dielectric constant and for correction of the virial coefficients of Clausius-Mossotti equation. The determination of changes in dielectric constant is related to the shift in the resonant frequency of a measuring cavity compared to a reference cavity. In this article we investigate the best conditions for the measurement to increase the sensitivity of system. Because of some unavoidable differences in the physical dimensions and electrical characteristics of the setup components, we studied the variation of the circuit parameters that could significantly have an impact on the sensitivity of the method.","PeriodicalId":315133,"journal":{"name":"2008 International Conference on Microwave and Millimeter Wave Technology","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-04-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 International Conference on Microwave and Millimeter Wave Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMMT.2008.4540477","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A resonant-cavity based microwave differential technique has been developed and used for the detection of a dielectric constant and for correction of the virial coefficients of Clausius-Mossotti equation. The determination of changes in dielectric constant is related to the shift in the resonant frequency of a measuring cavity compared to a reference cavity. In this article we investigate the best conditions for the measurement to increase the sensitivity of system. Because of some unavoidable differences in the physical dimensions and electrical characteristics of the setup components, we studied the variation of the circuit parameters that could significantly have an impact on the sensitivity of the method.