CSTAR database for advanced test systems

C. Hunter, R. B. Southard
{"title":"CSTAR database for advanced test systems","authors":"C. Hunter, R. B. Southard","doi":"10.1109/ECTC.1993.346837","DOIUrl":null,"url":null,"abstract":"The CSTAR (cards status tracking recording) database tracks inventory redesign/failure history of the field replaceable units (cards and components) that make up the VLSI device advanced test systems (ATS) that have been designed and manufactured at IBM, East Fishkill. CSTAR obsoletes the process of logging hardware failures in a notebook where inventory and failure-to-repair actions can not be easily identified. CSTAR provides an automatic serial number generator facility for new card tracking, status histories of all cards, SQL reports for analyzing failure histories for the most frequently used repair process, engineering change summaries per card, and a comprehensive user's guide (on-line and hard copy.) CSTAR runs in a distributed environment with LANs providing the link to a centralized database enabling all information to be immediately available to all authorized users in the laboratory and manufacturing test areas. Since repair attempts now have a consistent approach, second and third shift problem take over is accelerated and simplified, and hardware maintenance programs are forecasted, there is enhanced equipment reliability by reduced unplanned maintenance and quicker turn around time.<<ETX>>","PeriodicalId":281423,"journal":{"name":"Proceedings of IEEE 43rd Electronic Components and Technology Conference (ECTC '93)","volume":"94 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE 43rd Electronic Components and Technology Conference (ECTC '93)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.1993.346837","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

The CSTAR (cards status tracking recording) database tracks inventory redesign/failure history of the field replaceable units (cards and components) that make up the VLSI device advanced test systems (ATS) that have been designed and manufactured at IBM, East Fishkill. CSTAR obsoletes the process of logging hardware failures in a notebook where inventory and failure-to-repair actions can not be easily identified. CSTAR provides an automatic serial number generator facility for new card tracking, status histories of all cards, SQL reports for analyzing failure histories for the most frequently used repair process, engineering change summaries per card, and a comprehensive user's guide (on-line and hard copy.) CSTAR runs in a distributed environment with LANs providing the link to a centralized database enabling all information to be immediately available to all authorized users in the laboratory and manufacturing test areas. Since repair attempts now have a consistent approach, second and third shift problem take over is accelerated and simplified, and hardware maintenance programs are forecasted, there is enhanced equipment reliability by reduced unplanned maintenance and quicker turn around time.<>
CSTAR数据库用于先进的测试系统
CSTAR(卡片状态跟踪记录)数据库跟踪组成VLSI设备高级测试系统(ATS)的现场可更换单元(卡片和组件)的库存重新设计/故障历史,这些系统是由IBM在East Fishkill设计和制造的。CSTAR取消了在笔记本中记录硬件故障的过程,因为在笔记本中,库存和故障修复操作不容易识别。CSTAR为新卡跟踪、所有卡的状态历史、用于分析最常用维修过程的故障历史的SQL报告、每个卡的工程变更摘要以及全面的用户指南(在线和硬拷贝)提供了自动序列号生成器工具。CSTAR在分布式环境中运行,局域网提供与集中数据库的链接,使实验室和制造测试区域的所有授权用户能够立即获得所有信息。由于维修尝试现在有了一致的方法,第二和第三个班次的问题接管被加速和简化,硬件维护计划被预测,通过减少计划外维护和更快的周转时间,提高了设备的可靠性
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