{"title":"CSTAR database for advanced test systems","authors":"C. Hunter, R. B. Southard","doi":"10.1109/ECTC.1993.346837","DOIUrl":null,"url":null,"abstract":"The CSTAR (cards status tracking recording) database tracks inventory redesign/failure history of the field replaceable units (cards and components) that make up the VLSI device advanced test systems (ATS) that have been designed and manufactured at IBM, East Fishkill. CSTAR obsoletes the process of logging hardware failures in a notebook where inventory and failure-to-repair actions can not be easily identified. CSTAR provides an automatic serial number generator facility for new card tracking, status histories of all cards, SQL reports for analyzing failure histories for the most frequently used repair process, engineering change summaries per card, and a comprehensive user's guide (on-line and hard copy.) CSTAR runs in a distributed environment with LANs providing the link to a centralized database enabling all information to be immediately available to all authorized users in the laboratory and manufacturing test areas. Since repair attempts now have a consistent approach, second and third shift problem take over is accelerated and simplified, and hardware maintenance programs are forecasted, there is enhanced equipment reliability by reduced unplanned maintenance and quicker turn around time.<<ETX>>","PeriodicalId":281423,"journal":{"name":"Proceedings of IEEE 43rd Electronic Components and Technology Conference (ECTC '93)","volume":"94 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE 43rd Electronic Components and Technology Conference (ECTC '93)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.1993.346837","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
The CSTAR (cards status tracking recording) database tracks inventory redesign/failure history of the field replaceable units (cards and components) that make up the VLSI device advanced test systems (ATS) that have been designed and manufactured at IBM, East Fishkill. CSTAR obsoletes the process of logging hardware failures in a notebook where inventory and failure-to-repair actions can not be easily identified. CSTAR provides an automatic serial number generator facility for new card tracking, status histories of all cards, SQL reports for analyzing failure histories for the most frequently used repair process, engineering change summaries per card, and a comprehensive user's guide (on-line and hard copy.) CSTAR runs in a distributed environment with LANs providing the link to a centralized database enabling all information to be immediately available to all authorized users in the laboratory and manufacturing test areas. Since repair attempts now have a consistent approach, second and third shift problem take over is accelerated and simplified, and hardware maintenance programs are forecasted, there is enhanced equipment reliability by reduced unplanned maintenance and quicker turn around time.<>