A Simple compact model for hot carrier injection phenomenon in 32 nm NAND flash memory device

Abstract

In this work, a SPICE-friendly hot carrier injection (HCI) model for NAND flash memory has been proposed. By applying the HCI model to the 32 nm NAND product, the simulation based on HCI model showed good agreement with the measurement results. Based on the proposed model, a complex problem regarding the program disturbance in the scaled NAND flash memory array can be predicted through simple circuit simulations. Moreover, it is very useful in developing the ultra-short channel devices for high density multi-level cell (MLC) NAND flash technologies.