ISTFA 2018 Highlights: All Things Failure Analysis, in Four Impactful Days

{"title":"ISTFA 2018 Highlights: All Things Failure Analysis, in Four Impactful Days","authors":"","doi":"10.31399/asm.edfa.2019-1.p032","DOIUrl":null,"url":null,"abstract":"\n The 44th International Symposium for Testing and Failure Analysis (ISTFA 2018) was held in Phoenix, Ariz., October 28 - November 1, 2018. This article provides a summary of the highlights and identifies key contributors to the event. It also includes a summary of a panel discussion on the topic “Failures Worth Analyzing.” It concludes with discussion highlights from the Focused Ion Beam, Sample Preparation, and Contactless Fault Isolation/Nanoprobing user group meetings held at the conference.","PeriodicalId":431761,"journal":{"name":"EDFA Technical Articles","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"EDFA Technical Articles","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.31399/asm.edfa.2019-1.p032","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

The 44th International Symposium for Testing and Failure Analysis (ISTFA 2018) was held in Phoenix, Ariz., October 28 - November 1, 2018. This article provides a summary of the highlights and identifies key contributors to the event. It also includes a summary of a panel discussion on the topic “Failures Worth Analyzing.” It concludes with discussion highlights from the Focused Ion Beam, Sample Preparation, and Contactless Fault Isolation/Nanoprobing user group meetings held at the conference.
ISTFA 2018的亮点:在四个有影响力的日子里,对所有事物进行故障分析
第44届测试与失效分析国际研讨会(ISTFA 2018)在亚利桑那州凤凰城举行。, 2018年10月28日至11月1日。本文提供了一个重点摘要,并确定了该事件的主要贡献者。它还包括关于“值得分析的失败”主题的小组讨论的摘要。最后,重点讨论了在会议上举行的聚焦离子束、样品制备和非接触式故障隔离/纳米探测用户组会议。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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