Quantum electronic trap-to-band transitions in chalcogenides induced by electron-electron interaction

F. Buscemi, E. Piccinini, F. Giovanardi, M. Rudan, R. Brunetti, C. Jacoboni
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引用次数: 3

Abstract

Charge transport in amorphous-chalcogenide materials used for manufacturing memory devices is determined by two mechanisms: hopping of trapped electrons and motion of band electrons. Electron-electron interaction is investigated here as one of the mechanisms mainly responsible for the trap-to-band transitions. The problem is tackled using a fully quantum-mechanical approach by numerically solving the two-particle, time-dependent Schrödinger equation. The results show that the detrapping probability increases with the current density, this supporting the interpretation by which successive electron-electron scattering events may play a major role in the determining the snap-back of the I(V) characteristic in this kind of materials.
电子-电子相互作用诱导硫族化合物中量子电子阱-带跃迁
用于制造存储器件的非晶硫系材料中的电荷输运是由两种机制决定的:捕获电子的跳跃和带电子的运动。电子-电子相互作用是这里研究的机制之一,主要负责陷阱到带跃迁。这个问题是用完全量子力学的方法来解决的,通过数值解决两粒子,时间相关的Schrödinger方程。结果表明,脱陷概率随电流密度的增加而增加,这支持了连续的电子-电子散射事件可能在决定这类材料的I(V)特性的快速恢复中起主要作用的解释。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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