F. Buscemi, E. Piccinini, F. Giovanardi, M. Rudan, R. Brunetti, C. Jacoboni
{"title":"Quantum electronic trap-to-band transitions in chalcogenides induced by electron-electron interaction","authors":"F. Buscemi, E. Piccinini, F. Giovanardi, M. Rudan, R. Brunetti, C. Jacoboni","doi":"10.1109/SISPAD.2011.6035051","DOIUrl":null,"url":null,"abstract":"Charge transport in amorphous-chalcogenide materials used for manufacturing memory devices is determined by two mechanisms: hopping of trapped electrons and motion of band electrons. Electron-electron interaction is investigated here as one of the mechanisms mainly responsible for the trap-to-band transitions. The problem is tackled using a fully quantum-mechanical approach by numerically solving the two-particle, time-dependent Schrödinger equation. The results show that the detrapping probability increases with the current density, this supporting the interpretation by which successive electron-electron scattering events may play a major role in the determining the snap-back of the I(V) characteristic in this kind of materials.","PeriodicalId":264913,"journal":{"name":"2011 International Conference on Simulation of Semiconductor Processes and Devices","volume":"43 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 International Conference on Simulation of Semiconductor Processes and Devices","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SISPAD.2011.6035051","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
Charge transport in amorphous-chalcogenide materials used for manufacturing memory devices is determined by two mechanisms: hopping of trapped electrons and motion of band electrons. Electron-electron interaction is investigated here as one of the mechanisms mainly responsible for the trap-to-band transitions. The problem is tackled using a fully quantum-mechanical approach by numerically solving the two-particle, time-dependent Schrödinger equation. The results show that the detrapping probability increases with the current density, this supporting the interpretation by which successive electron-electron scattering events may play a major role in the determining the snap-back of the I(V) characteristic in this kind of materials.