SEU characterization of an embedded 130nm compiled SRAM in heavy ion and proton environments

M. Von Thun, D. Walz, Radu Dumitru, Anthony L. Wilson, T. Farris
{"title":"SEU characterization of an embedded 130nm compiled SRAM in heavy ion and proton environments","authors":"M. Von Thun, D. Walz, Radu Dumitru, Anthony L. Wilson, T. Farris","doi":"10.1109/NSREC.2017.8115462","DOIUrl":null,"url":null,"abstract":"Embedded Compiled SRAMs are included as part of the Cobham 130nm Radiation Hardened ASIC design environment. Previous testing of the Cobham 130nm library was performed at Lawrence Berkeley National Laboratory and is reported in the following references [1]–[4]. This work describes additional characterization of two architectures of compiled embedded SRAMs in heavy ion and proton environments. Heavy ion testing was performed at the Texas A&M University Cyclotron Institute (TAMU) and proton testing was performed at the TRI-University Meson Facility (TRIUMF).","PeriodicalId":284506,"journal":{"name":"2017 IEEE Radiation Effects Data Workshop (REDW)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE Radiation Effects Data Workshop (REDW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NSREC.2017.8115462","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

Embedded Compiled SRAMs are included as part of the Cobham 130nm Radiation Hardened ASIC design environment. Previous testing of the Cobham 130nm library was performed at Lawrence Berkeley National Laboratory and is reported in the following references [1]–[4]. This work describes additional characterization of two architectures of compiled embedded SRAMs in heavy ion and proton environments. Heavy ion testing was performed at the Texas A&M University Cyclotron Institute (TAMU) and proton testing was performed at the TRI-University Meson Facility (TRIUMF).
嵌入式130nm编译SRAM在重离子和质子环境下的SEU表征
嵌入式编译sram包括作为Cobham 130nm辐射硬化ASIC设计环境的一部分。Cobham 130nm文库的先前测试是在劳伦斯伯克利国家实验室进行的,并在以下参考文献[1]-[4]中报道。这项工作描述了在重离子和质子环境下编译嵌入式sram的两种架构的附加特征。重离子测试在德克萨斯A&M大学回旋加速器研究所(TAMU)进行,质子测试在TRI-University介子设施(TRIUMF)进行。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信