Laser-based Noncontact In SZTU Overdrive Of Electronic Modules

Abstract

The costs of removing printed wiring boards for analysis along with the decreasing feature sizes associated with microelectronic components and circuit boards has initiated the research and development of fine-pitch, in situ test systems. We have continued development of a nonxontact testing system to analyze PWBs while under operation. The potential of this system to overdrive logic circuits via signal injection has also been investigated, in which the data indicates this NCT approach is an excellent technique to analyze hardware under operation without disruption. Results also indicate that this NCT electrode would be an excellent “front-end-tester” for systems that are already in-service, thereby providing a low cost improvement of existing hardware.