R. Kochan, A. Sachenko, V. Kochan, M. Yanovsky, Orest Kochan, V. Kharchenko
{"title":"Improving the data reliability of measurement and control modules for distributed information-measuring systems","authors":"R. Kochan, A. Sachenko, V. Kochan, M. Yanovsky, Orest Kochan, V. Kharchenko","doi":"10.1109/ELNANO.2017.7939806","DOIUrl":null,"url":null,"abstract":"A method of improving the reliability of sensory data coming from measurement and control modules of distributed information-measuring systems and control actions formed by those modules is described. The proposed technical solutions by correcting additive, multiplicative and nonlinear error components of analog-to-digital converters provide the high reliability, survivability and. The preliminary reliability assessment of the proposed module is carried-out, and it confirmed the redundancy mechanisms need to be applied on the individual microcontroller, the sensor and the individual execution unit.","PeriodicalId":333746,"journal":{"name":"2017 IEEE 37th International Conference on Electronics and Nanotechnology (ELNANO)","volume":"301 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE 37th International Conference on Electronics and Nanotechnology (ELNANO)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ELNANO.2017.7939806","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
A method of improving the reliability of sensory data coming from measurement and control modules of distributed information-measuring systems and control actions formed by those modules is described. The proposed technical solutions by correcting additive, multiplicative and nonlinear error components of analog-to-digital converters provide the high reliability, survivability and. The preliminary reliability assessment of the proposed module is carried-out, and it confirmed the redundancy mechanisms need to be applied on the individual microcontroller, the sensor and the individual execution unit.