{"title":"A readout circuit for an uncooled IR camera with mismatch and self-heating compensation","authors":"Daniel Svard, C. Jansson, A. Alvandpour","doi":"10.1109/NORCHP.2012.6403138","DOIUrl":null,"url":null,"abstract":"This paper presents a readout integrated circuit for an infrared focal plane array intended to be used in infrared network attached video cameras in surveillance applications. The focal plane array consists of 352×288 uncooled microbolometer detectors with a pitch of 25 μm. The circuit features mismatch correction and a non-linear ramped current pulse scheme for biasing of the detectors, in order to relax the dynamic range requirement of preamplifiers and ADC imposed by detector process variation and self-heating during readout. The integrated circuit is designed in a 0.35 μm standard CMOS process and a smaller 32×32 size test chip has been fabricated for verification. The test chip shows RMS input referred noise of 17 μV at 60 frames/second and dissipates 170 mW of power.","PeriodicalId":332731,"journal":{"name":"NORCHIP 2012","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"NORCHIP 2012","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NORCHP.2012.6403138","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
This paper presents a readout integrated circuit for an infrared focal plane array intended to be used in infrared network attached video cameras in surveillance applications. The focal plane array consists of 352×288 uncooled microbolometer detectors with a pitch of 25 μm. The circuit features mismatch correction and a non-linear ramped current pulse scheme for biasing of the detectors, in order to relax the dynamic range requirement of preamplifiers and ADC imposed by detector process variation and self-heating during readout. The integrated circuit is designed in a 0.35 μm standard CMOS process and a smaller 32×32 size test chip has been fabricated for verification. The test chip shows RMS input referred noise of 17 μV at 60 frames/second and dissipates 170 mW of power.