P. Kuindersma, T. Hoang, J. Schmitz, M. Vijayaraghavan, M. Dijkstra, W. van Noort, T. Vanhoucke, William C. Peters, M.C.J.C.M. Kramer
{"title":"The power conversion efficiency of visible light emitting devices in standard BiCMOS processes","authors":"P. Kuindersma, T. Hoang, J. Schmitz, M. Vijayaraghavan, M. Dijkstra, W. van Noort, T. Vanhoucke, William C. Peters, M.C.J.C.M. Kramer","doi":"10.1109/GROUP4.2008.4638164","DOIUrl":null,"url":null,"abstract":"We present experimental and theoretical proof for a single and unique relationship between the breakdown voltage and power efficiency of visible light emitting devices fabricated in standard BiCMOS processes.","PeriodicalId":210345,"journal":{"name":"2008 5th IEEE International Conference on Group IV Photonics","volume":"349 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-10-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"14","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 5th IEEE International Conference on Group IV Photonics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/GROUP4.2008.4638164","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 14
Abstract
We present experimental and theoretical proof for a single and unique relationship between the breakdown voltage and power efficiency of visible light emitting devices fabricated in standard BiCMOS processes.