S. Miyazaki, H. Murakami, M. Ikeda, E. Yoshida, A. Kohno, M. Hirose
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引用次数: 0
Abstract
In this paper, we describe a formation mechanism of nanometer Si dots on thermally-grown SiO/sub 2/ during LPCVD using SiH/sub 4/. And also, for MOS devices with nanometer Si dots as a floating gate, we demonstrate the memory operation due to electron charging to the dots at room temperature.