{"title":"Geometrical modelling of current gain ratio for a bipolar transistor","authors":"F. Iosif","doi":"10.1109/ECAI.2013.6636181","DOIUrl":null,"url":null,"abstract":"This paper presents a method of determining the superior cut-off frequency for bipolar, alloyed transistors. This method is based on a geometrical modelling of the current gain ratio for this type of transistors; the modeling takes in consideration the displacement of the mobile charge carriers and the technological quantities material dependent.","PeriodicalId":105698,"journal":{"name":"Proceedings of the International Conference on ELECTRONICS, COMPUTERS and ARTIFICIAL INTELLIGENCE - ECAI-2013","volume":"74 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the International Conference on ELECTRONICS, COMPUTERS and ARTIFICIAL INTELLIGENCE - ECAI-2013","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECAI.2013.6636181","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper presents a method of determining the superior cut-off frequency for bipolar, alloyed transistors. This method is based on a geometrical modelling of the current gain ratio for this type of transistors; the modeling takes in consideration the displacement of the mobile charge carriers and the technological quantities material dependent.