VLS growth of silicon nanowires in cold wall Cat-CVD chamber

Sanchar Acharya, A. Kottantharayil
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引用次数: 3

Abstract

Growth of silicon nanowires by Vapour-Liquid-Solid (VLS) method has been studied in a cold wall Catalytic Chemical Vapour Deposition (Cat-CVD) chamber. It has been found that the instrument can be used in two modes, Hot Wire Chemical Vapour Deposition (HWCVD) and Chemical Vapour Deposition (CVD). These modes are tested with two methods for the preparation of the catalyst nanoparticles, namely thermal annealing of catalyst thin film and chemical attachment of catalyst nanoparticles. Growth in HWCVD mode is faster but the nanowires have deformities like conical shape, short length and uncatalyzed silicon deposition on the substrate. Using the CVD mode with modified process parameters solves these problems. The resultant silicon nanowires are characterized by Scanning Electron Microscopy, Energy-dispersive X-ray spectroscopy and Transmission Electron Microscopy.
冷壁Cat-CVD室中硅纳米线的VLS生长
在冷壁催化化学气相沉积(Cat-CVD)实验室内研究了气-液-固(VLS)法制备硅纳米线。实验结果表明,该仪器可在热丝化学气相沉积(HWCVD)和化学气相沉积(CVD)两种模式下工作。对这些模式进行了两种制备催化剂纳米粒子的方法,即催化剂薄膜的热退火和催化剂纳米粒子的化学附着。在HWCVD模式下,纳米线的生长速度较快,但在衬底上存在锥形、短长度和未催化硅沉积等缺陷。采用改变工艺参数的CVD模式解决了这些问题。用扫描电子显微镜、能量色散x射线能谱和透射电子显微镜对合成的硅纳米线进行了表征。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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