Write-enhanced Single-ended 11T SRAM Enabling Single Bitcell Reconfigurable Compute-in-Memory Employing Complementary FETs

W. You, Cheng-Yin Wang, Yih Wang, T. Chang, S. Liao
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Abstract

A write-enhanced single-ended 11T complementary FET (CFET) SRAM capable of performing reconfigurable compute-in-memory (CIM) using a single bitcell is presented for the first time. By leveraging the dummy PFETs within the standard 6T (or 8T) CFET SRAM layout, the write ability of the proposed 11T SRAM can be enhanced more than 2.5 times compared with the 6T (or 8T) SRAM without sacrificing the write half-selected disturb. In addition, the dummy PFETs acting as additional write transistors offers an opportunity to perform Boolean CIM with three reconfigurable schemes introduced in this work. By employing the CFET technology, the 11T CFET SRAM cell shows tiny area overhead compared with the 6T high current SRAM cell (HCC) using non-stacked CMOS and has a comparable footprint as the standard 8T CFET SRAM cell.
利用互补场效应管实现单位元可重构内存计算的写增强单端11T SRAM
首次提出了一种写增强单端11T互补场效应管SRAM,该SRAM能够使用单个位元进行可重构的内存计算。通过利用标准6T(或8T) CFET SRAM布局中的假pfet,与6T(或8T) SRAM相比,所提出的11T SRAM的写入能力可以提高2.5倍以上,而不会牺牲写入半选择干扰。此外,作为额外写入晶体管的假pfet提供了一个机会,通过本工作中介绍的三种可重构方案执行布尔CIM。通过采用CFET技术,与使用非堆叠CMOS的6T高电流SRAM单元(HCC)相比,11T CFET SRAM单元显示出很小的面积开销,并且具有与标准8T CFET SRAM单元相当的占地面积。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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