Optical properties of the undoped and SiOx doped DLC films

Š. Meškinis, V. Kopustinskas, Kęstutis Šlapikas, R. Gudaitis, S. Tamulevičius, G. Niaura, V. Rinnerbauer, K. Hingerl
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引用次数: 8

Abstract

In present study DLC films were deposited by direct ion beam deposition. Hexamethyldisiloxane vapor and hydrogen gas mixture, mixture of the hexamethyldisiloxane with acetylene as well as acetylene gas alone has been used as a source of the hydrocarbons. Optical properties of the synthesized films were investigated by spectroscopic ellipsometry. Structure of the DLC films has been studied by means of the Raman spectroscopy. Effects of the technological deposition parameters such as composition of the gas precursors, ion beam energy, ion beam current density were considered.
未掺杂和SiOx掺杂DLC薄膜的光学性质
本研究采用直接离子束沉积法沉积DLC薄膜。六甲基二硅氧烷蒸汽和氢气混合物,六甲基二硅氧烷与乙炔的混合物以及单独的乙炔气体被用作碳氢化合物的来源。利用椭偏光谱法研究了合成膜的光学性质。用拉曼光谱研究了DLC薄膜的结构。考虑了气相前驱体成分、离子束能量、离子束电流密度等工艺参数的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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